ELEMENT MAPPING BY A SCANNING X-RAY SYSTEMGURKER N.1979; X-RAY SPECTROM.; GBR; DA. 1979; VOL. 8; NO 4; PP. 149-158; BIBL. 12 REF.Article

AUFLOESUNGSVERBESSERUNG DURCH ENTFALTUNG. = AUGMENTATION DU POUVOIR DE RESOLUTION PAR DECONVOLUTIONGURKER N.1978; J. ELECTRON. SPECTROSC. RELAT. PHENOMENA; NLD; DA. 1978; VOL. 14; NO 1; PP. 1-18; ABS. ENG; BIBL. 18 REF.Article

Imaging techniques for X-ray fluorescence and X-ray diffraction = Techniques de la formation d'images pour la fluorescence de rayons X et la diffraction de rayons XGURKER, N.Advances in x-ray analysis. 1987, Vol 30, pp 53-65, issn 0376-0308Conference Paper

XPS-INVESTIGATION OF CONTAMINATION LAYERS.PERSY K; GURKER N.1978; J. ELECTRON. SPECTROSC. RELAT. PHENOMENA; NETHERL.; DA. 1978; VOL. 13; NO 2; PP. 91-95; BIBL. 3 REF.Article

DECONVOLUTION OF THE XPS-VALENCE BAND SPECTRUM OF GOLD.EBEL H; GURKER N.1975; PHYS. LETTERS, A; NETHERL.; DA. 1975; VOL. 50; NO 6; PP. 449-450; BIBL. 11 REF.Article

Coded imaging X-ray microprobeBAVDAZ, M; GURKER, N.X-ray spectrometry. 1993, Vol 22, Num 2, pp 65-70, issn 0049-8246Article

BEITRAEGE ZUR CHEMIE DER PYROLPIGMENTE. XXI. ROENTGENPHOTOELEKTRONENSPKTROMETRISCHE UNTERSUCHUNGEN DES N1S-NIVEAUS VON GALLENPIGMENTEN = CHIMIE DES PIGMENTS PYRROLIQUES. XXI. ETUDE PAR SPECTROMETRIE PHOTOELECTRONIQUE PAR RX DU NIVEAU N_1S DES PIGMENTS DE LA BILEFALK H; GRUBMAYR K; THIRRING K et al.1978; MONATSH. CHEM.; AUT; DA. 1978; VOL. 109; NO 5; PP. 1183-1189; ABS. ENG; BIBL. 25 REF.Article

AN X-RAY SPECTROMETER WITH A POSITION-SENSITIVE WIRE DETECTOR (PSD)EBEL H; MANTLER M; GURKER N et al.1983; X-RAY SPECTROMETRY; ISSN 0049-8246; GBR; DA. 1983; VOL. 12; NO 1; PP. 47-49Article

INTERPRETATION OF GHOST LINES IN SECONDARY-ELECTRON SPECTRA DETERMINED BY XPS = INTERPRETATION DES RAIES FANTOMES DANS LES SPECTRES D'ELECTRONS SECONDAIRES DETERMINES PAR XPSGURKER N; EBEL H; ZEINER K et al.1982; J. ELECTRON SPECTROSC. RELAT. PHENOM.; ISSN 0368-2048; NLD; DA. 1982; VOL. 25; NO 2-3; PP. 219-229; BIBL. 10 REF.Article

Imaging XPS with a hemispherical analyzer and multichannelplate detectionEBEL, H; EBEL, M. F; MANTLER, M et al.Surface science. 1990, Vol 231, Num 1-2, pp 233-239, issn 0039-6028, 7 p.Conference Paper

Experiments on imaging X-ray analytical methodsGURKER, N; EBEL, M. F; EBEL, H et al.Surface and interface analysis. 1989, Vol 14, Num 4, pp 163-169, issn 0142-2421Article

Imaging XPS: a new technique. II: Experimental verificationGURKER, N; EBEL, M. F; MANTLER, M et al.Surface and interface analysis. 1987, Vol 10, Num 5, pp 242-249, issn 0142-2421Article

Computer-aided resolution enhancement for XPS imaging of an uncharged single chemical speciesGRABHERR, M. G; EBEL, M. F; GURKER, N et al.Surface and interface analysis. 1992, Vol 18, Num 11, pp 781-783, issn 0142-2421Article